October 6 - 9, 2008
Mohonk Mountain House
New Paltz, New York  USA


2008 IEEE International SOI Conference

Short Course                BACK

Extreme SOI - Technology, Applications, Test

The theme of the 2008 SOI Conference Short Course is extreme operation and applications of SOI circuits. The course will be taught by an international group of leading experts in the following topics: Ultra low power technology, soft errors in advanced technologies, high temperature electronics, built in self test, photonic circuits, and extreme ultra low power devices. Participants will receive copies of all visual presentations.

Vyshnavi Suntharalingam
MIT Lincoln Lab
Lexington, MA

Short Course Instructors

SOI Ultra Low Power Technology and Application

Anne Vandooren, IMEC


Radiation Effects in Advanced SOI Technology

Véronique Ferlet-Cavrois, CEA


SOI CMOS Devices and Circuits for High Temperature Electronics

Denis Flandre, UCL

Built-In Self-Test and Repair of Embedded Compilable Memories for SOI ASICs

Mike Ouellette and Harold Pilo, IBM


SOI Photonic Circuits and Optical Interconnects

Mehdi Asghari, Kotura Inc.

Future Prospects for Extreme Ultra Low Power SOI Devices and Circuits

Wilfried Haensch, IBM

Short Course Registration Fees

In addition to the Short Course Workbook (both hardcopy & CD), Short Course registration fees include Monday breakfast, lunch, and dinner.

IEEE Member $410 $435
Non-IEEE Member $460 $510
Student, IEEE Member $160 $190
Student, Non-IEEE Member $215 $245